white-light interferometer

基本解释

In white-light interferometer, the parameters of white-light sources influence the shape of the interferogram and the central fringe identification.
在白光干涉仪中，白光光源的参数决定了干涉条纹的分布，对中心条纹的识别精度产生直接影响。
A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain.
本文介绍了一种利用光谱型白光干涉系统测量光学薄膜绝对反射相位的方法。
The interference signal of white-light interferometer with several broadband light sources is the superposition of those only with one broadband light source.
使用多个宽带光源构成的组合光源的白光干涉仪，其干涉信号为单个光源干涉信号的叠加，从而使干涉信号强度重新分布。

白光干涉
The white light interferometer was based on the Michelson interferometer and the technique is a convenient, high resolution, noncontact method. It can meet the need of small measurement range and high resolution simultaneously.
该系统是基于麦克尔逊干涉仪设计的白光干涉系统，具有结构简单，操作方便，安全性高，抗干扰能力强等特点，可以广泛地用于液位测量和监控，特别适合于小范围高分辨率的测量要求。