transmission electron microscopy tem

基本解释

A TecnaiG220AEM instrument was used for the transmission electron microscopy (TEM) study.
透射电镜（TEM）采用TecnaiG220AEM透射电镜分析仪。
The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact angle measurements.
用扫描电镜、透射电镜、X射线衍射、接触角测量等技术对表面进行了表征。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). transmission electron microscopy (TEM) and atom force microscopy (AFM).
并用扫描电子显微镜（SEM）、透射电子显微镜（TEM）和原子力显微镜（AFM）对阳极氧化铝膜的形貌和结构进行了表征。