interference microscopy

基本解释

Phase stepping error causes measuring errors in differential interference contrast microscopy.
相移误差是影响干涉显微镜测量表面形貌精度的主要因素之一。
A method for measuring the refractive index profile of a graded-index optical fibre using the holographic interference microscopy is presented.
本文介绍用双曝光全息干涉显微法测量自聚焦棒透镜折射率分布的测量原理。
Investigation of the resulting annular disruption was carried out using microcomputed tomography and differential interference contrast microscopy.
采用显微CT扫描和微分干涉差显微镜进行纤维环破裂的研究。

To do this, they used interference reflection microscopy, a technique that reveals details smaller than the wavelength of light itself.
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